Pulse shape analysis in segmented detectors as a technique for background reduction in Ge double-beta decay experiments

نویسندگان

  • S. R. Elliott
  • V. M. Gehman
چکیده

The need to understand and reject backgrounds in Ge-diode detector double-beta decay experiments has given rise to the development of pulse shape analysis in such detectors to discern single-site energy deposits from multiple-site deposits. Here, we extend this analysis to segmented Ge detectors to study the effectiveness of combining segmentation with pulse shape analysis to identify the multiplicity of the energy deposits.

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تاریخ انتشار 2005